Atomic Force Microscopy/Scanning Tunneling Microscopy 2 (v. 2)
Book Details
Publisher
Springer
ISBN / ASIN
030645596X
ISBN-13
9780306455964
Availability
Usually ships in 2 to 4 weeks
Sales Rank
#10,755,319
Marketplace
United States 🇺🇸
Description
Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
