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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

AuthorManoj Sachdev, Jose Pineda de Gyvez
PublisherSpringer
CategoryTechnology & Engineering
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Book Details

Author(s)Manoj Sachdev, Jose Pineda de Gyvez
PublisherSpringer
ISBN / ASIN0387465464
ISBN-139780387465463
CategoryTechnology & Engineering
MarketplaceUnited States  🇺🇸

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circ…
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