Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
Book Details
Author(s)
Wai Kin Chim
Publisher
Wiley
ISBN / ASIN
047149240X
ISBN-13
9780471492405
Availability
In stock. Usually ships within 2 to 3 days.
Sales Rank
#2,085,708
Category
Science
Marketplace
United States 🇺🇸
Description
Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
