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Built In Test for VLSI: Pseudorandom Techniques

AuthorBardell, Paul H.
PublisherWiley
CategoryComputers
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Book Details

Author(s)Bardell, Paul H.
PublisherWiley
ISBN / ASIN0471624632
ISBN-139780471624639
AvailabilityUsually ships within 3 to 4 days
CategoryComputers
MarketplaceCanada  🇨🇦

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