Electron Microscopy and Multiscale Modeling - EMMM - 2007: An International Conference (AIP Conference Proceedings / Materials Physics and Applications)
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Book Details
Publisher
American Institute of Physics
ISBN / ASIN
0735405190
ISBN-13
9780735405196
Category
Science
Marketplace
France 🇫🇷
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Description
The EMMM-2007 Conference brought together leading experts in electron microscopy and materials modeling from around the world to explore how to synergistically combine atomic scale characterization and modeling to enhance the development of new materials.
