The 10th International Conference on X-Ray Microscopy (AIP Conference Proceedings / Accelerators, Beams, and Instrumentations) Buy on Amazon
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The 10th International Conference on X-Ray Microscopy (AIP Conference Proceedings / Accelerators, Beams, and Instrumentations)

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Book Details
ISBN / ASIN 0735409250
ISBN-13 9780735409255
Availability Usually ships in 1 to 3 weeks
Marketplace United States 🇺🇸
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Description
This conference proceedings would be of interest to researchers and students in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution x-ray microscopy and imaging, magnetism and magnetic materials, biological and biomedical sciences, and materials and condensed matter sciences. The 10th International Conference on X-ray Microscopy (XRM 2010) was held on August 15-20, 2010 in Chicago, Illinois, USA. The latest advances in x-ray microscopy instrumentation and methods and their applications to biology, environmental, magnetism, and materials science were presented at XRM 2010.
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