IEEE N42.31-2003: American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation Buy on Amazon
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IEEE N42.31-2003: American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

Author IEEE
Publisher IEEE
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Book Details
Author(s) IEEE
Publisher IEEE
ISBN / ASIN 0738137995
ISBN-13 9780738137995
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