Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Name: Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Author: Pineda de Gyvez, José
ISBN: 9780792393061

Author Pineda de Gyvez, José

Publisher Springer

Category Hardcover

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Book Details

Author(s) Pineda de Gyvez, José

Publisher Springer

ISBN / ASIN 0792393066

ISBN-13 9780792393061

Availability Only 1 left in stock.

Category Hardcover

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