Electronics Reliability and Measurement Technology: Nondestructive Evaluation
Book Details
Author(s)Joseph S. Heyman
PublisherWilliam Andrew
ISBN / ASIN081551171X
ISBN-139780815511717
AvailabilityUsually ships in 24 hours
Sales Rank4,714,436
CategoryTechnology & Engineering
MarketplaceUnited States 🇺🇸
Description
This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
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