Characterization of Semiconductor Materials, Volume 1: Principles and Methods (Volume 1)
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Book Details
Author(s)
McGuire, Gary F.
Publisher
William Andrew
ISBN / ASIN
0815512007
ISBN-13
9780815512004
Marketplace
France 🇫🇷
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Description
Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.
