1996 IEEE Vlsi Test Symposium: April 28-May 1, 1996 Princeton, New Jersey
Book Details
Author(s)IEEE VLSI Test Symposium
PublisherIeee Computer Society
ISBN / ASIN0818673044
ISBN-139780818673047
AvailabilityIn stock. Usually ships within 2 to 3 days.
Sales Rank16,174,618
CategoryPaperback
MarketplaceUnited States 🇺🇸
Description
Reports on recent concepts, methodologies, and trends in testing electronic circuits and systems to meet the challenges of a wider range of capabilities being integrated into compact products, and the higher quality being demanded. Some 90 papers explore such aspects as designing for testability, on
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