1996 IEEE Vlsi Test Symposium: April 28-May 1, 1996 Princeton, New Jersey
Book Details
Author(s)
IEEE VLSI Test Symposium
Publisher
Ieee Computer Society
ISBN / ASIN
0818673044
ISBN-13
9780818673047
Category
Paperback
Marketplace
France 🇫🇷
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Description
Reports on recent concepts, methodologies, and trends in testing electronic circuits and systems to meet the challenges of a wider range of capabilities being integrated into compact products, and the higher quality being demanded. Some 90 papers explore such aspects as designing for testability, on
