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Multilayer and Grazing Incidence X-Ray/Euv Optics for Astronomy and Projection Lithography: 19-22 July 1992 San Diego, California (Proceedings of Spie) Buy on Amazon

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Multilayer and Grazing Incidence X-Ray/Euv Optics for Astronomy and Projection Lithography: 19-22 July 1992 San Diego, California (Proceedings of Spie)

AuthorRichard B. Hoover
PublisherSociety of Photo Optical
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Book Details

Author(s)Richard B. Hoover
PublisherSociety of Photo Optical
ISBN / ASIN0819409154
ISBN-139780819409157
MarketplaceFrance  🇫🇷

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