Ultrafast X-ray Detectors, High-speed Imaging, and Applications (Proceedings of Spie)
Book Details
Author(s)Stuart Kleinfelder, Dennis L. Paisley, Zenghu Chang, Jean-Claude Kieffer, Jerome B. Hastings
PublisherSociety of Photo Optical
ISBN / ASIN0819459259
ISBN-139780819459251
AvailabilityUsually ships in 24 hours
MarketplaceUnited States 🇺🇸
