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Reliability, Packaging, Testing, and Characterization of Mems/ Moems and Nanodevices VIII (Proceedings of Spie)

Name: Reliability, Packaging, Testing, and Characterization of Mems/ Moems and Nanodevices VIII (Proceedings of Spie)
Author: Unknown
ISBN: 9780819474520

PublisherSociety of Photo Optical

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Book Details

PublisherSociety of Photo Optical

ISBN / ASIN0819474525

ISBN-139780819474520

AvailabilityUsually ships in 1 to 3 weeks

MarketplaceUnited States 🇺🇸