Reliability, Packaging, Testing, and Characterization of Mems/ Moems and Nanodevices VIII (Proceedings of Spie)

Name: Reliability, Packaging, Testing, and Characterization of Mems/ Moems and Nanodevices VIII (Proceedings of Spie)
Author: Unknown
ISBN: 9780819474520

Publisher Society of Photo Optical

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Book Details

Publisher Society of Photo Optical

ISBN / ASIN 0819474525

ISBN-13 9780819474520

Availability Usually ships in 1 to 3 weeks

Marketplace United States 🇺🇸

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