Analysis and Evaluation of Sampled Imaging Systems (SPIE Tutorial Text Vol. TT87) (Tutorial Texts in Optical Engineering)

Advancing technology in detector arrays, flat panel displays, and digital image processing provides new opportunities to expand imaging applications and enhance system performance. Technical managers and design engineers are faced with evaluating the cost, weight, and performance of an ever-expanding selection of technology options. This tutorial text provides the theory, procedures, and information necessary to evaluate and compare the performance of available imaging technologies. Part I updates the earlier work presented in Analysis of Sampled Imaging Systems (2000). Part II discusses performance evaluation of electro-optical imagers. Part III provides computer programs (on a supplemental CD-ROM) and up-to-date information on detector arrays, optics, and display options.

The book covers a variety of display formats and interfaces, and provides detailed information on available focal plane arrays (FPAs). Particular emphasis is placed on theory and practice for the wide variety of available infrared FPAs. Technologies represented include InSb, HgCdTe, QWIP, and uncooled thermal arrays. Information is provided on the quantum efficiency, blur, crosstalk, and noise characteristics of each technology. The detector and array dimensions of available FPAs are provided. The information on optics, display, and FPA subassemblies allows the model user to make quick and realistic performance assessments of electro-optical imager designs.