Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V: 24-25 August 2011, San Diego, California, United States
Price not available for France
You can still browse on Amazon. Try another country above.
Book Details
Author(s)
Michael T. Postek
Publisher
SPIE Press
ISBN / ASIN
0819487155
ISBN-13
9780819487155
Marketplace
France 🇫🇷
Ratings & Reviews
No reviews yet — be the first!
No reviews yet.
