Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI: 23-24 January 2012, San Francisco, California, United States
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Book Details
Author(s)
Sonia Garcia-Blanco
Publisher
SPIE Press
ISBN / ASIN
0819488933
ISBN-13
9780819488930
Marketplace
France 🇫🇷
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