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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI: 23-24 January 2012, San Francisco, California, United States Buy on Amazon

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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI: 23-24 January 2012, San Francisco, California, United States

AuthorSonia Garcia-Blanco
PublisherSPIE Press
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Book Details

Author(s)Sonia Garcia-Blanco
PublisherSPIE Press
ISBN / ASIN0819488933
ISBN-139780819488930
MarketplaceFrance  🇫🇷

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