Advances and Applications in the Metallography and Characterization of Materials and Microelectronic Components: Proceedings of the Twenty-Eighth ... Society (Microstructural Science , Vol 23)

Volume 23. Renowned metallographers, metallurgists and materials scientists from 10 countries contributed to these important proceedings. This 316-page resource features a guide through the intricacies of tailoring microstructures in silicon nitride ceramics to make them more reliable when used as engineering components. Furthermore, in an overview of phase transformations and their metallography, there's a detailed explanation of shape memory alloy effects. Contents include: Behavior of Nonmetallic Materials and Devices, Behavior of Nonferrous Metals, Failure Analysis of Microelectronic Packages and Devices, Structure/Property Relationships for Iron and Steel, Steel Failure at High Temperatures, Sample Preparation for Metallography and Other Purposes, Applied Microscopy and Image Analysis, Behavior in Novel Applications, and Microelectronic Characterization.