Scanned Probe Microscopy. AIP Conference Proceedings, No. 241 Buy on Amazon
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Scanned Probe Microscopy. AIP Conference Proceedings, No. 241

Publisher American Inst. of Physics
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Book Details
Publisher American Inst. of Physics
ISBN / ASIN 0883188163
ISBN-13 9780883188163
Availability Usually ships in 24 hours
Sales Rank #14,440,356
Marketplace United States 🇺🇸
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Description
Researchers in microscopy, practitioners in biology, materials science, engineering and physics.
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