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Measurement and Modeling of Silicon Heterostructure Devices
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Measurement and Modeling of Silicon Heterostructure Devices
Author
John D. Cressler
Publisher
CRC Press
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Book Details
Author(s)
John D. Cressler
Publisher
CRC Press
ISBN / ASIN
1420066927
ISBN-13
9781420066920
Marketplace
France 🇫🇷
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