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Yield Simulation for Integrated Circuits (The Springer International Series in Engineering and Computer Science)

Name: Yield Simulation for Integrated Circuits (The Springer International Series in Engineering and Computer Science)
Author: D.M. Walker
ISBN: 9781441952011

AuthorD.M. Walker

PublisherSpringer

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Author(s)D.M. Walker

PublisherSpringer

ISBN / ASIN1441952012

ISBN-139781441952011

AvailabilityUsually ships in 24 hours

Sales Rank9,276,902

MarketplaceUnited States 🇺🇸

Yield Simulation for Integrated Circuits (The Springer International Series in Engineering and Computer Science)

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