https://www.ebooknetworking.net/books_detail-146128595X.html

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)

Name: From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
Author: Jitendra B. Khare, Wojciech Maly
ISBN: 9781461285953

AuthorJitendra B. Khare, Wojciech Maly

PublisherSpringer

Shop on Amazon — choose your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

179.00 USD

Buy New on Amazon 🇺🇸

Book Details

Author(s)Jitendra B. Khare, Wojciech Maly

PublisherSpringer

ISBN / ASIN146128595X

ISBN-139781461285953

MarketplaceUnited States 🇺🇸

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)

Book Details

More Books by Jitendra B. Khare, Wojciech Maly