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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)

Name: From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
Author: Jitendra B. Khare, Wojciech Maly
ISBN: 9781461285953

AuthorJitendra B. Khare, Wojciech Maly

PublisherSpringer

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Book Details

Author(s)Jitendra B. Khare, Wojciech Maly

PublisherSpringer

ISBN / ASIN146128595X

ISBN-139781461285953

MarketplaceFrance 🇫🇷

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)

Book Details

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