From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)

Name: From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
Author: Jitendra B. Khare, Wojciech Maly
ISBN: 9780792397144

AuthorJitendra B. Khare, Wojciech Maly

PublisherSpringer

CategoryComputers

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Book Details

Author(s)Jitendra B. Khare, Wojciech Maly

PublisherSpringer

ISBN / ASIN0792397142

ISBN-139780792397144

CategoryComputers

MarketplaceFrance 🇫🇷

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)

Book Details

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