OCM 2013 - Optical Characterization of Materials : Conference Proceedings
Book Details
Author(s)Juergen Beyerer
PublisherKIT Scientific Publishing
ISBN / ASIN3866449658
ISBN-139783866449657
AvailabilityUsually ships in 24 hours
Sales Rank99,999,999
MarketplaceUnited States 🇺🇸
Description
The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.

