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X-Ray Diffraction: Modern Experimental Techniques

PublisherPan Stanford
145.45 149.95 USD
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Book Details

PublisherPan Stanford
ISBN / ASIN9814303593
ISBN-139789814303590
AvailabilityUsually ships in 24 hours
Sales Rank2,208,243
MarketplaceUnited States  🇺🇸

Description

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

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