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Microcircuit device reliability: Memory/LSI data, winter 77-78

AuthorHenry C Rickers
PublisherReliability Analysis Center, Rome Air Development Center
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Book Details

Author(s)Henry C Rickers
PublisherReliability Analysis Center, Rome Air Development Center
ISBN / ASINB0006WR0N2
ISBN-13978B0006WR0N4
MarketplaceFrance  🇫🇷
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