Does One size fit all? The International Patent regime.(International Trade): An article from: Harvard International Review Buy on Amazon

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Does One size fit all? The International Patent regime.(International Trade): An article from: Harvard International Review

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ISBN / ASINB00082FY0Q
ISBN-13978B00082FY06
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Sales Rank11,357,983
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Description

This digital document is an article from Harvard International Review, published by Harvard International Relations Council, Inc. on June 22, 2004. The length of the article is 2971 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.

Citation Details
Title: Does One size fit all? The International Patent regime.(International Trade)
Author: Graham Dutfield
Publication:Harvard International Review (Refereed)
Date: June 22, 2004
Publisher: Harvard International Relations Council, Inc.
Volume: 26 Issue: 2 Page: 50(5)

Distributed by Thomson Gale

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