Characterization challenges increase at the nanoscale. (Commentary).(probe tip of an atomic force microscope): An article from: Nanoparticle News
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Book Details
Author(s)
Mindy N. Rittner
Publisher
Business Communications Company, Inc.
ISBN / ASIN
B0008DLL4I
ISBN-13
978B0008DLL46
Marketplace
Germany 🇩🇪
