Optimizing component placement: CMM vs. AOI: together, non-contact coordinate measurement machines and automatic optical inspection systems can ... An article from: Circuits Assembly
Book Details
Author(s)Vijay Patel
PublisherUP Media Group, Inc.
ISBN / ASINB0008DY6HM
ISBN-13978B0008DY6H2
MarketplaceFrance 🇫🇷
Description
This digital document is an article from Circuits Assembly, published by UP Media Group, Inc. on May 1, 2002. The length of the article is 2249 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.
Citation Details
Title: Optimizing component placement: CMM vs. AOI: together, non-contact coordinate measurement machines and automatic optical inspection systems can provide placement process control.(Component Placement)
Author: Vijay Patel
Publication:Circuits Assembly (Magazine/Journal)
Date: May 1, 2002
Publisher: UP Media Group, Inc.
Volume: 13 Issue: 5 Page: 24(3)
Distributed by Thomson Gale
Citation Details
Title: Optimizing component placement: CMM vs. AOI: together, non-contact coordinate measurement machines and automatic optical inspection systems can provide placement process control.(Component Placement)
Author: Vijay Patel
Publication:Circuits Assembly (Magazine/Journal)
Date: May 1, 2002
Publisher: UP Media Group, Inc.
Volume: 13 Issue: 5 Page: 24(3)
Distributed by Thomson Gale
