Integrated facilities design using a contour distance metric.(Statistical Data Included): An article from: IIE Transactions Buy on Amazon

Integrated facilities design using a contour distance metric.(Statistical Data Included): An article from: IIE Transactions

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Book Details
ISBN / ASIN B0008HSYFS
ISBN-13 978B0008HSYF8
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Description
This digital document is an article from IIE Transactions, published by Institute of Industrial Engineers, Inc. (IIE) on April 1, 2001. The length of the article is 5467 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.

Citation Details
Title: Integrated facilities design using a contour distance metric.(Statistical Data Included)
Author: Bryan A. Norman
Publication:IIE Transactions (Refereed)
Date: April 1, 2001
Publisher: Institute of Industrial Engineers, Inc. (IIE)
Volume: 33 Issue: 4 Page: 337

Article Type: Statistical Data Included

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