Functional Test in a High-Density PCB Environment -- Careful design, a well-planned test strategy and the proper tools will provide credible ... Article): An article from: Circuits Assembly
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Book Details
Author(s)
Bob Stasonis
Publisher
UP Media Group, Inc.
ISBN / ASIN
B0008IL44K
ISBN-13
978B0008IL442
Marketplace
United Kingdom 🇬🇧
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Description
This digital document is an article from Circuits Assembly, published by UP Media Group, Inc. on August 1, 2001. The length of the article is 2039 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.
Citation Details
Title: Functional Test in a High-Density PCB Environment -- Careful design, a well-planned test strategy and the proper tools will provide credible functional test results.(Brief Article)
Author: Bob Stasonis
Publication:Circuits Assembly (Magazine/Journal)
Date: August 1, 2001
Publisher: UP Media Group, Inc.
Page: 37
Article Type: Brief Article
Distributed by Thomson Gale
Citation Details
Title: Functional Test in a High-Density PCB Environment -- Careful design, a well-planned test strategy and the proper tools will provide credible functional test results.(Brief Article)
Author: Bob Stasonis
Publication:Circuits Assembly (Magazine/Journal)
Date: August 1, 2001
Publisher: UP Media Group, Inc.
Page: 37
Article Type: Brief Article
Distributed by Thomson Gale
