The Cluster Approach for In-Circuit and Functional Testing -- The cluster approach can improve testing efficiency and reduce broken pile for OEMs and ... Article): An article from: Circuits Assembly

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Citation Details
Title: The Cluster Approach for In-Circuit and Functional Testing -- The cluster approach can improve testing efficiency and reduce broken pile for OEMs and EMS providers.(Brief Article)
Author: Slav Ligai
Publication:Circuits Assembly (Magazine/Journal)
Date: August 1, 2001
Publisher: UP Media Group, Inc.
Page: 44

Article Type: Brief Article

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