Using SPC in the semiconductor industry. (statistical process control): An article from: Industrial Management

This digital document is an article from Industrial Management, published by Institute of Industrial Engineers, Inc. (IIE) on January 1, 1997. The length of the article is 2992 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.

From the supplier: Motorola Inc. decided to implement statistical process control at the final test phase of its integrated circuits. A cross-functional team was formed to have the process under control within a year. Reviews of the process flow of electrical test and scanner showed that accuracy, repeatability and parts handling are important elements. Gauge repeatability and reproduction studies and experiment design were also found to be crucial in optimizing parameters.

Citation Details
Title: Using SPC in the semiconductor industry. (statistical process control)
Author: Sanjoy Kumar
Publication:Industrial Management (Magazine/Journal)
Date: January 1, 1997
Publisher: Institute of Industrial Engineers, Inc. (IIE)
Volume: v39 Issue: n1 Page: p5(4)

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