Too much ado about testing.(scholastic aptitude test)(Review) (book reviews): An article from: Issues in Science and Technology

This digital document is an article from Issues in Science and Technology, published by National Academy of Sciences on December 22, 1999. The length of the article is 1673 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.

Citation Details
Title: Too much ado about testing.(scholastic aptitude test)(Review) (book reviews)
Author: Kevin Finneran
Publication:Issues in Science and Technology (Refereed)
Date: December 22, 1999
Publisher: National Academy of Sciences
Volume: 16 Issue: 2 Page: 90

Article Type: Book Review

Distributed by Thomson Gale