A general accelerated life model for step-stress testing.: An article from: IIE Transactions

This digital document is an article from IIE Transactions, published by Thomson Gale on November 1, 2005. The length of the article is 6423 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.

From the author: In this paper we propose a general accelerated life model for step-stress testing and present a general likelihood function formulation for step-stress models that use both Weibull and lognormal distributions. The proposed model is also applicable to any life distribution in which the stress level only changes the scale parameter of the distribution, and can also be extended to multiple-stress as well as profiled testing patterns. Algorithms for fitting and testing such models are described and illustrated. The model provides a convenient way to interpret the step-stress accelerated life testing results. The practical use of the proposed statistical inference model is demonstrated by a case study.

Citation Details
Title: A general accelerated life model for step-stress testing.
Author: Wenbiao Zhao
Publication:IIE Transactions (Magazine/Journal)
Date: November 1, 2005
Publisher: Thomson Gale
Volume: 37 Issue: 11 Page: 1059(11)

Distributed by Thomson Gale