High Resolution X-Ray Diffractometry and Topography Buy on Amazon

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High Resolution X-Ray Diffractometry and Topography

Book Details

ISBN / ASINB000Q35ZFQ
ISBN-13978B000Q35ZF4
Sales Rank2,545,507
MarketplaceUnited States  🇺🇸

Description

The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the b...
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