High Resolution X-Ray Diffractometry and Topography
Book Details
Author(s)BRIAN K.TANNER
ISBN / ASINB000Q35ZFQ
ISBN-13978B000Q35ZF4
Sales Rank2,545,507
MarketplaceUnited States 🇺🇸
Description
The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the b...
