Highly accurate likelihood analysis for the seemingly unrelated regression problem [An article from: Journal of Econometrics]
Book Details
Author(s)D.A.S. Fraser, M. Rekkas, A. Wong
PublisherElsevier
ISBN / ASINB000RR7QQM
ISBN-13978B000RR7QQ1
MarketplaceFrance 🇫🇷
Description
This digital document is a journal article from Journal of Econometrics, published by Elsevier in . The article is delivered in HTML format and is available in your Amazon.com Media Library immediately after purchase. You can view it with any web browser.
Description:
The linear and nonlinear seemingly unrelated regression problem with general error distribution is analyzed using recent likelihood theory that arguably provides the definitive distribution for assessing a scalar parameter; this involves implicit but well defined conditioning and marginalization for determining intrinsic measures of departure. Highly accurate p-values are obtained for the key difference between two regression coefficients of central interest. The p-value gives the statistical position of the data with respect to the key parameter. The theory and the results indicate that this methodology provides substantial improvement on first-order likelihood procedures, both in distributional accuracy, and in precise measurement of the key parameter.
Description:
The linear and nonlinear seemingly unrelated regression problem with general error distribution is analyzed using recent likelihood theory that arguably provides the definitive distribution for assessing a scalar parameter; this involves implicit but well defined conditioning and marginalization for determining intrinsic measures of departure. Highly accurate p-values are obtained for the key difference between two regression coefficients of central interest. The p-value gives the statistical position of the data with respect to the key parameter. The theory and the results indicate that this methodology provides substantial improvement on first-order likelihood procedures, both in distributional accuracy, and in precise measurement of the key parameter.
