ISO 21270:2004, Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale

ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid. This title may contain less than 24 pages of technical content.