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System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)

Name: System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)
Author: Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
ISBN: 978B00177VDO3

AuthorLaung-Terng Wang, Charles E. Stroud, Nur A. Touba

PublisherMorgan Kaufmann

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Book Details

Author(s)Laung-Terng Wang, Charles E. Stroud, Nur A. Touba

PublisherMorgan Kaufmann

ISBN / ASINB00177VDO2

ISBN-13978B00177VDO3

MarketplaceUnited States 🇺🇸

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