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System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon) Buy on Amazon

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System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)

AuthorLaung-Terng Wang, Charles E. Stroud, Nur A. Touba
PublisherMorgan Kaufmann
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Book Details

Author(s)Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
PublisherMorgan Kaufmann
ISBN / ASINB00177VDO2
ISBN-13978B00177VDO3
MarketplaceGermany  🇩🇪

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