When a good DOE goes bad: estimate the time constant of a process prior to conducting the DOE to prevent erroneous results.(FAB BASICS): An article from: Printed Circuit Design & Fab

This digital document is an article from Printed Circuit Design & Fab, published by UP Media Group, Inc. on June 1, 2008. The length of the article is 1091 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available immediately after purchase. You can view it with any web browser.

Citation Details
Title: When a good DOE goes bad: estimate the time constant of a process prior to conducting the DOE to prevent erroneous results.(FAB BASICS)
Author: J. Lee Parker
Publication:Printed Circuit Design & Fab (Magazine/Journal)
Date: June 1, 2008
Publisher: UP Media Group, Inc.
Volume: 25 Issue: 6 Page: 38(2)

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