Characterization of thin films and solid surfaces using proton-induced X-ray emission Buy on Amazon
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Characterization of thin films and solid surfaces using proton-induced X-ray emission

Author Bruce D. Sartwell
Publisher University of Michigan Library
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Book Details
Author(s) Bruce D. Sartwell
Publisher University of Michigan Library
ISBN / ASIN B003HIXR4S
ISBN-13 978B003HIXR47
Availability Usually ships in 24 hours
Marketplace United States 🇺🇸
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