Scanning electron microscope examination of wire bonds from high-reliability devices
Book Details
Author(s)
Kathryn O. Leedy
Publisher
University of Michigan Library
ISBN / ASIN
B004124N60
ISBN-13
978B004124N63
Availability
Usually ships in 24 hours
Sales Rank
#8,316,595
Marketplace
United States 🇺🇸
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