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Scanning electron microscope examination of wire bonds from high-reliability devices

AuthorKathryn O. Leedy
PublisherUniversity of Michigan Library
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Book Details

Author(s)Kathryn O. Leedy
PublisherUniversity of Michigan Library
ISBN / ASINB004124N60
ISBN-13978B004124N63
AvailabilityUsually ships in 24 hours
Sales Rank8,316,595
MarketplaceUnited States  🇺🇸
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