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The dopant density and temperature dependence of electron m…
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The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon
Author
Sheng S. Li
Publisher
University of Michigan Library
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Book Details
Author(s)
Sheng S. Li
Publisher
University of Michigan Library
ISBN / ASIN
B0041KJG6E
ISBN-13
978B0041KJG67
Marketplace
United States 🇺🇸
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