https://www.ebooknetworking.net/books_detail-B0041KJG6E.html

The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon

Name: The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon
Author: Sheng S. Li
ISBN: 978B0041KJG67

AuthorSheng S. Li

PublisherUniversity of Michigan Library

Shop on Amazon — choose your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

13.99 USD

Buy New on Amazon 🇺🇸

Book Details

Author(s)Sheng S. Li

PublisherUniversity of Michigan Library

ISBN / ASINB0041KJG6E

ISBN-13978B0041KJG67

MarketplaceUnited States 🇺🇸

The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon

Book Details

More Books by Sheng S. Li