Substrate effect and application of the elastic foundation model to evaluate atomic force microscope nanoindentations of thin polymeric film.(Report): An article from: Polymer Engineering and Science
Book Details
PublisherSociety of Plastics Engineers, Inc.
ISBN / ASINB005H5RFU6
ISBN-13978B005H5RFU2
MarketplaceIndia 🇮🇳
Description
This digital document is an article from Polymer Engineering and Science, published by Society of Plastics Engineers, Inc. on August 1, 2011. The length of the article is 4257 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available immediately after purchase. You can view it with any web browser.
From the author: The analysis of the mechanical properties of thin films by nanoindentation has been recently subject of numerous theoretical and phenomenological studies as well as numerical simulations. In this work, we report on the application of the Winkler elastic foundation theory to analyze atomic force microscope nanoindentations of poly(n-butyl methacrylate) films with thicknesses of 90, 196, and 485 nm. The elastic moduli of the samples were found to be 1.13 [+ or -] 0.43 GPa, 1.34 [+ or -] 0.32 GPa and 1.23 [+ or -] 0.24 GPa, respectively, after indentations of at least 50% of the film thickness. These data rely on the independent determination of the mechanical properties of 485-nm thick films, using Sneddon's model at low penetration depth (yielding 1.27 [+ or -] 0.37 GPa). Our data show that the substrate effects begins to be noticeable only after indenting to a depth of more than 40% of the film thickness. POLYM. ENG. SCI., 51:1507-1512, 2011. [c] 2011 Society of Plastics Engineers
Citation Details
Title: Substrate effect and application of the elastic foundation model to evaluate atomic force microscope nanoindentations of thin polymeric film.(Report)
Author: Davide Tranchida
Publication:Polymer Engineering and Science (Magazine/Journal)
Date: August 1, 2011
Publisher: Society of Plastics Engineers, Inc.
Volume: 51 Issue: 8 Page: 1507(6)
Article Type: Report
Distributed by Gale, a part of Cengage Learning
From the author: The analysis of the mechanical properties of thin films by nanoindentation has been recently subject of numerous theoretical and phenomenological studies as well as numerical simulations. In this work, we report on the application of the Winkler elastic foundation theory to analyze atomic force microscope nanoindentations of poly(n-butyl methacrylate) films with thicknesses of 90, 196, and 485 nm. The elastic moduli of the samples were found to be 1.13 [+ or -] 0.43 GPa, 1.34 [+ or -] 0.32 GPa and 1.23 [+ or -] 0.24 GPa, respectively, after indentations of at least 50% of the film thickness. These data rely on the independent determination of the mechanical properties of 485-nm thick films, using Sneddon's model at low penetration depth (yielding 1.27 [+ or -] 0.37 GPa). Our data show that the substrate effects begins to be noticeable only after indenting to a depth of more than 40% of the film thickness. POLYM. ENG. SCI., 51:1507-1512, 2011. [c] 2011 Society of Plastics Engineers
Citation Details
Title: Substrate effect and application of the elastic foundation model to evaluate atomic force microscope nanoindentations of thin polymeric film.(Report)
Author: Davide Tranchida
Publication:Polymer Engineering and Science (Magazine/Journal)
Date: August 1, 2011
Publisher: Society of Plastics Engineers, Inc.
Volume: 51 Issue: 8 Page: 1507(6)
Article Type: Report
Distributed by Gale, a part of Cengage Learning
